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Continuous 3-day exposure assessment of workplace manufacturing silver nanoparticles
Link to Journal Abstract
With the increased production and widespread use of nanomaterials, human and environmental exposure to nanomaterials is inevitably increasing. Therefore, this study monitored the possible nanoparticle exposure at a workplace that manufactures silver nanoparticles. To estimate the potential exposure of workers, personal sampling, area monitoring, and real-time monitoring were conducted over 3 days using a scanning mobility particle sizer and dust monitor at a workplace where the workers handle nanomaterials. The area sampling concentrations obtained from the injection room showed the highest concentration, ranging from 0.00501 to 0.28873 mg/m3. However, apart from the injection room, none of the area samplings obtained from other locations showed a concentration higher than 0.0013 mg/m3. Meanwhile, the personal sampling concentrations ranged from 0.00004 to 0.00243 mg/m3 over the 3 days of sampling, which was much lower than the silver TLV. The particle number concentrations at the silver nanoparticle manufacturing workplace were 911,170 (1st day), 1,631,230 (2nd day), and 1,265,024 (3rd day) particles/cm3 with a size range of 15–710.5 nm during the operation of the reactor, while the concentration decreased to 877,364.9 (1st day), 492,732 (2nd day), and 344,343 (3rd day) particles/cm3 when the reactor was stopped.
This study monitored the possible nanoparticle exposure at a workplace that manufactures silver nanoparticles. To estimate the potential exposure of workers, personal sampling, area monitoring, and real-time monitoring were conducted over 3 days using a scanning mobility particle sizer and dust monitor at a workplace where the workers handle nanomaterials.
Peer Reviewed Journal Article
Exposure Or Hazard Target
Method Of Study
Material Analysis and Applications
Risk Exposure Group
Journal of Nanoparticle Research, 14(9): 1134 (September 2012)
Journal of Nanoparticle Research
Lee JH, Ahn K, Kim SM, Jeon KS, Lee JS, Yu IJ
Last updated on October 19, 2012
This work is supported in part by the Nanoscale Science and Engineering Initiative of the National Science Foundation
under NSF Award Number EEC-0118007.
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